• DocumentCode
    1563021
  • Title

    A new approach to obtain I-V and P-V curves of photovoltaic modules by using DC-DC converters

  • Author

    Enrique, J.M. ; Duran, E. ; M, Andujar J. ; Andujar, J.M. ; Bohorquez, M.A. ; Carretero, Jesus

  • Author_Institution
    Departamento de Ingenieria Electron., de Sistemas Informaticos y Autom., Universidad de Huelva, Spain
  • fYear
    2005
  • Firstpage
    1769
  • Lastpage
    1772
  • Abstract
    The achievement of I-V and P-V curves of photovoltaic modules gives the possibility of obtaining their characteristic parameters: the short-circuit current (I/sub sc/), the open-circuit voltage (V/sub oc/), the maximum power point (MPP) and the fill factor (FF). These values are significant for the design of a photovoltaic system. These curves depend on the global irradiance (G), the temperature (T) and the spectral distribution of the solar irradiation. In this paper, a new methodology to determine the afore mentioned curves by using DC-DC converters is proposed. This methodology allows carrying out the complete sweep of the voltage and the current (including V/sub oc/ and I/sub sc/). Regarding the traditional methods, this new one provides the following advantages: a) minimum power loss with regard to the systems that operate in lineal zone (active zone); this implies several advantages in size and cost; and b) this new method allows an automatic adaptation of the interpolation interval.
  • Keywords
    DC-DC power convertors; short-circuit currents; solar cells; solar radiation; DC-DC converters; global irradiance; open-circuit voltage; photovoltaic modules; photovoltaic system; short-circuit current; solar irradiation; spectral distribution; Circuits; Costs; DC-DC power converters; Impedance; Photovoltaic systems; Pulse width modulation; Solar power generation; Temperature dependence; Temperature distribution; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE
  • Conference_Location
    Lake Buena Vista, FL, USA
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-8707-4
  • Type

    conf

  • DOI
    10.1109/PVSC.2005.1488493
  • Filename
    1488493