DocumentCode
1563114
Title
A method of outliers detection based on amend sequential probabilistic ratio analysis
Author
Yang, Tianqi
Author_Institution
Comput. Sci. Dept., Jinan Univ., Guangzhou, China
Volume
5
fYear
2004
Firstpage
4327
Abstract
Outlier detection is a statistical problem that has received considerable attention. A common approach is assuming that the (possible) outliers are generated by contaminating models. It is known that sequential probabilistic ratio analysis (ASPR) is not very sensitive to outliers. Therefore, identification of outliers is possible for exploring appropriate model structures and determining reliable estimates of parameters. This paper examines the use of amend sequential probabilistic ratio analysis for outlier detection. We develop identification indices for detecting observations that influence the SPR estimates, higher. Finally, an example is given to illustrate the daily average number of car manufacturing defects application in the proposed detection.
Keywords
automobile manufacture; automobiles; parameter estimation; probability; statistical analysis; amend sequential probabilistic ratio analysis; car manufacturing defects; contaminating models; identification indices; model structures; outlier identification; outliers detection; parameter estimation; statistical problem; Computer science; Manufacturing; Parameter estimation; Sequential analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent Control and Automation, 2004. WCICA 2004. Fifth World Congress on
Print_ISBN
0-7803-8273-0
Type
conf
DOI
10.1109/WCICA.2004.1342329
Filename
1342329
Link To Document