• DocumentCode
    1563114
  • Title

    A method of outliers detection based on amend sequential probabilistic ratio analysis

  • Author

    Yang, Tianqi

  • Author_Institution
    Comput. Sci. Dept., Jinan Univ., Guangzhou, China
  • Volume
    5
  • fYear
    2004
  • Firstpage
    4327
  • Abstract
    Outlier detection is a statistical problem that has received considerable attention. A common approach is assuming that the (possible) outliers are generated by contaminating models. It is known that sequential probabilistic ratio analysis (ASPR) is not very sensitive to outliers. Therefore, identification of outliers is possible for exploring appropriate model structures and determining reliable estimates of parameters. This paper examines the use of amend sequential probabilistic ratio analysis for outlier detection. We develop identification indices for detecting observations that influence the SPR estimates, higher. Finally, an example is given to illustrate the daily average number of car manufacturing defects application in the proposed detection.
  • Keywords
    automobile manufacture; automobiles; parameter estimation; probability; statistical analysis; amend sequential probabilistic ratio analysis; car manufacturing defects; contaminating models; identification indices; model structures; outlier identification; outliers detection; parameter estimation; statistical problem; Computer science; Manufacturing; Parameter estimation; Sequential analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Control and Automation, 2004. WCICA 2004. Fifth World Congress on
  • Print_ISBN
    0-7803-8273-0
  • Type

    conf

  • DOI
    10.1109/WCICA.2004.1342329
  • Filename
    1342329