Analysis of the magnetization switching in CoCrPtTa thin films by magneto-optic Kerr effect vector magnetometry

Summary form only given. The magnetization switching of CoCrPtTa thin films for longitudinal recording media is studied by means of the 3D magneto-optic Kerr effect vector magnetometry. The films have large coercivity (2200-2900 Oe) and small thickness (10-15 nm). They are deposited by DC sputtering on a CrV underlayer, using a NiAl seed layer and a glass substrate. The technique used enables the determination of the three components of the magnetization, as a function of the applied field. Such a knowledge offers a great insight into the mechanism of magnetization reversal during the hysteresis loop cycle, revealing to what extent magnetization reversal occurs via coherent rotation of a well defined magnetization vector, rather than development of a domain structure.