Title :
Mapping coercivity variation on patterned magneto-optical media
Author :
Te-Ho Wu ; Ye, L.X. ; Lee, J.M. ; Wu, J.C. ; Shieh, H.-P.D.
Author_Institution :
Dept. of Humanities & Sci., Nat. Yunlin Univ. of Sci. & Technol., Touliu, Taiwan
Abstract :
Summary form only given. Our previous studies indicated that the coercivity of patterned magneto-optical (MO) thin film media is quite different from the non-patterned samples. Especially, the coercivity of the hole area is quite different from the land area. In order to understand the quantitative difference of the coercivity between the hole and land regions, we have used a Kerr microscope to acquire the variation feature of the coercivity over the patterned and non-patterned MO media surface.
Keywords :
coercive force; magneto-optical recording; storage media; Kerr microscope; coercivity variation mapping; hole regions; land regions; magneto-optical thin film media; patterned magneto-optical media; Coercive force; Glass; Land surface; Magnetic fields; Magnetic force microscopy; Magnetic multilayers; Magnetic properties; Physics; Printing; Transistors;
Conference_Titel :
Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
Conference_Location :
Amsterdam, The Netherlands
Print_ISBN :
0-7803-7365-0
DOI :
10.1109/INTMAG.2002.1000595
