DocumentCode
156333
Title
Technological optimization of the microwave hybrid and monolithic integrated circuits
Author
Agasieva, S.V. ; Leushin, V.Yu. ; Meshkov, S.A. ; Popov, V.V. ; Makeev, M.O.
Author_Institution
Moscow State Tech. Univ. n.a. N.E. Bauman, Moscow, Russia
fYear
2014
fDate
7-13 Sept. 2014
Firstpage
661
Lastpage
662
Abstract
The methodology of increasing of serial applicability indicators and reliability of microwave hybrid and monolithic integrated circuits (HIC and MIC) is offered. The modern MIC element base consists of multilayered semiconductor heterostructures. The methodology is based on modeling of degradation processes of microwave HIC and MIC heterostructure under the influence of external factors and development of technological optimization methods.
Keywords
MMIC; circuit optimisation; hybrid integrated circuits; integrated circuit reliability; HIC reliability; MIC element base; MIC reliability; degradation process modeling; microwave hybrid integrated circuits; monolithic integrated circuits; multilayered semiconductor heterostructures; technological optimization method; Life estimation;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave & Telecommunication Technology (CriMiCo), 2014 24th International Crimean Conference
Conference_Location
Sevastopol
Print_ISBN
978-966-335-412-5
Type
conf
DOI
10.1109/CRMICO.2014.6959575
Filename
6959575
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