DocumentCode :
1563424
Title :
Investigating head-disk interface issues at near-contact using take-off pressure measurements
Author :
Raman, V. ; Gillis, D.R. ; Wolter, R.F.
Author_Institution :
Storage Technol. Div., IBM Corp., San Jose, CA, USA
fYear :
2002
Abstract :
Summary form only given. It is widely recognized that as magnetic recording densities in hard disk drives approach hundreds of Gb/sq. in., the head-disk clearance is expected to be in the sub-10 nm range. This decrease in mechanical spacing represents a formidable challenge to assuring long-term mechanical reliability of the interface. Consequently, there are several efforts focused at developing improved components for flyability together with efforts at gaining an understanding of the physical processes that occur at small spacing. As a part of this effort, we have investigated a wide variety of head and disk components to assess the tribological aspects of the head-disk interface for applications in near-contact recording systems using a relatively simple test procedure. In this paper, we describe this procedure and the principal experimental results obtained in four specific areas: (a) the role of disk surface roughness and waviness; (b) the influence of disk lubricant thickness; (c) the effect of molecular weight of disk lubricant; and (d) slider attributes.
Keywords :
digital magnetic recording; disc drives; hard discs; lubrication; magnetic heads; reliability; surface topography; 10 nm; disk lubricant molecular weight; disk lubricant thickness; disk surface roughness; hard disk drives; head-disk clearance; head-disk interface; long-term mechanical reliability; magnetic recording; mechanical spacing; near-contact recording systems; slider attributes; take-off pressure measurements; tribological aspects; Actuators; Capacitance; Glass; Hafnium; Hard disks; Lubricants; Pressure measurement; Rough surfaces; Surface roughness; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
Conference_Location :
Amsterdam, The Netherlands
Print_ISBN :
0-7803-7365-0
Type :
conf
DOI :
10.1109/INTMAG.2002.1000611
Filename :
1000611
Link To Document :
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