DocumentCode
1563779
Title
Effect of Cr underlayer on obliquely sputtered Co on PET substrate
Author
Nguyen, L.T. ; Lisfi, A. ; Kim, P.L. ; Lodder, J.C. ; Keim, R.G.
Author_Institution
Syst. & Mater. for Inf. Storage Group, Twente Univ., Enschede, Netherlands
fYear
2002
Abstract
Summary form only given. Oblique deposition of magnetic films is often used for magnetic recording tape. The well known materials are Co and CoNi deposited by reactive evaporation with O/sub 2/ directly on a polymer substrate. However, for the next generation of high density media the desirable magnetic properties have not been achieved by this method. In our previous work, oblique sputtering of Co on a PET substrate resulted in a relative low H/sub c/, which mainly originates from shape anisotropy, as the films only consist of the fcc Co phase. In this paper, properties of sputtered Co on a Cr underlayer at an incident angle of 70° are reported. Microstructure and magnetic analyses of the Co layer reveal a strong influence of the Cr underlayer.
Keywords
atomic force microscopy; chromium; cobalt; coercive force; crystal microstructure; magnetic tapes; magnetic thin films; sputtered coatings; transmission electron microscopy; AFM; Co-Cr; Cr underlayer; PET substrate; TEM; film microstructure; hcp Co phase; hcp crystalline structure; high density media; in-plane coercivity; magnetic properties; magnetic recording tape; oblique sputtering; polymer substrate; sputtered Co; Anisotropic magnetoresistance; Chromium; Magnetic films; Magnetic materials; Magnetic properties; Magnetic recording; Polymers; Positron emission tomography; Shape; Sputtering;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
Conference_Location
Amsterdam, The Netherlands
Print_ISBN
0-7803-7365-0
Type
conf
DOI
10.1109/INTMAG.2002.1000649
Filename
1000649
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