Title :
Reduction of pole tip recession in linear recording heads
Author :
Sourty, E. ; Sullivan, J.L. ; de Jong, L.A.M.
Author_Institution :
Sch. of Eng. & Appl. Sci., Aston Univ., Birmingham, UK
Abstract :
Summary form only given. Using a range of experimental techniques, including optical microscopy (OM), atomic force microscopy (AFM), X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES), the major processes responsible for wear at the head to tape interface (HTI) of linear tape recording systems, and more specifically pole-tip recession (PTR), have been identified. Within a few tens of hours in sliding contact against a magnetic tape, the tape-bearing surface (TBS) ceramic (Al/sub 2/O/sub 3/-TiC) is found to undergo a preferential removal of material from the TiC grain surface. This process results in the production of TiC flakes which fragment and become trapped in the recessed pole tip region, hence acting as three-body abrasive particles. This dramatically increases PTR. This mechanism is supported by the presence of TiC particles detected by AES in the pole tip area. To overcome this phenomenon, two solutions are considered. The first consists of coating the whole head surface with a protective layer. The second is to replace the Al/sub 2/O/sub 3/-TiC with a single-phase ceramic TBS.
Keywords :
Auger electron spectra; X-ray photoelectron spectra; abrasion; atomic force microscopy; magnetic heads; magnetic tape storage; magnetic tapes; optical microscopy; protective coatings; sliding friction; AES; AFM; Al/sub 2/O/sub 3/-TiC; Al/sub 2/O/sub 3/-TiC tape-bearing surface ceramic; Auger electron spectroscopy; TiC; TiC flake fragments; TiC grain surface; X-ray photoelectron spectroscopy; XPS; atomic force microscopy; head surface protective coating; head to tape interface wear; linear recording heads; linear tape recording systems; magnetic tape; optical microscopy; pole tip area TiC particles; pole tip recession reduction; preferential material removal; recessed pole tip region trapped fragments; single-phase ceramic TBS; sliding contact; three-body abrasive particles; Atom optics; Atomic force microscopy; Ceramics; Electron microscopy; Magnetic heads; Magnetic materials; Optical microscopy; Optical recording; Photoelectron microscopy; Spectroscopy;
Conference_Titel :
Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
Conference_Location :
Amsterdam, The Netherlands
Print_ISBN :
0-7803-7365-0
DOI :
10.1109/INTMAG.2002.1000655