Title :
Flux-guide type tunnel-valve head for helical scan tape system
Author :
Nakashio, E. ; Sugawara, Jun ; Onoe, S. ; Kumagai, Shinya
Author_Institution :
Sony Corp., Miyagi, Japan
Abstract :
Summary form only given. In helical scan tape drives, wearing of the reader on the drum that rotates at high speed gives rise to the deterioration of reliability. In order to achieve high reliability and high density recording, flux-guide (FG) type MR readers using magnetic tunnel junctions were fabricated for the tape drives. A longitudinal biasing scheme, which combines permanent magnet biasing with a long-range exchange coupling biasing toward all the track positions (E. Nakashio et al, J. Appl. Phys. vol. 89, p. 7356, 2001), was utilized to stabilize the FG type tunnel-valve readers.
Keywords :
magnetic heads; magnetic tape storage; magnetoresistive devices; permanent magnets; tunnelling magnetoresistance; wear; FG type tunnel-valve reader stabilization; drum reader wear; flux-guide type MR readers; flux-guide type tunnel-valve head; helical scan tape drive; helical scan tape system; high density recording; long-range exchange coupling biasing; longitudinal biasing scheme; magnetic tunnel junctions; permanent magnet biasing; reliability deterioration; track positions; Anisotropic magnetoresistance; Couplings; Electrical resistance measurement; Magnetic heads; Magnetic tunneling; Oxidation; Permanent magnets; Plasma measurements; Tunneling magnetoresistance; Voltage;
Conference_Titel :
Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
Conference_Location :
Amsterdam, The Netherlands
Print_ISBN :
0-7803-7365-0
DOI :
10.1109/INTMAG.2002.1000657