Title :
High-Voltage, High-Frequency SiC Power MOSFETs Model Validation
Author :
Ortiz-Rodríguez, J.M. ; Duong, T. ; Rivera-López, Á ; Hefner, A.R., Jr.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg
Abstract :
Circuit simulator model validation procedures and results are presented for SiC power MOSFETs. The characteristics discussed include on-state conduction, resistive load switching, inductive load switching, and high voltage depletion capacitance. The validation procedures are performed using a script written in the AIM language that is incorporated in the Saberreg* circuit simulator. The script uses the model parameter sets from the IGBT Model Parameter ExtrACTion (IMPACT) tools to perform simulations and then compares the simulated results with measured characteristics. Example validation results are presented for recently developed 5 A, 10 kV SiC power MOSFETs demonstrating for the first time the model performance at the full application switching voltage (5 kV for the 10 kV devices).
Keywords :
insulated gate bipolar transistors; power MOSFET; semiconductor device models; silicon compounds; wide band gap semiconductors; AIM language; IGBT model parameter extraction; Saber; SiC; circuit simulator model; current 5 A; high voltage depletion capacitance; inductive load switching; on-state conduction; power MOSFET; resistive load switching; semiconductor device model; voltage 10 kV; Circuit simulation; MOSFETs; NIST; Parameter extraction; Performance evaluation; Power electronics; Power semiconductor switches; Power system modeling; Silicon carbide; Voltage;
Conference_Titel :
Power Electronics Specialists Conference, 2007. PESC 2007. IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-0654-8
Electronic_ISBN :
0275-9306
DOI :
10.1109/PESC.2007.4342130