Title :
A fuzzy attributed graph approach to subcircuit extraction problem
Author :
Zhang, Nian ; Wunsch, Donald C., II
Author_Institution :
Dept. of Electr. & Comput. Eng., Missouri Univ., Rolla, MO, USA
Abstract :
Fuzzy attributed graph (FAG) is not only widely used in the fields of image understanding and pattern recognition, but is useful to fuzzy graph matching problem. One of the applications of fuzzy graph matching is the subcircuit extraction problem. Subcircuit extraction problem is very important for VLSI testing, layout versus schematic (LVS) check, and circuit partition, etc. In this paper, fuzzy attributed graph (FAG) is first effectively applied to the subgraph isomorphism problem. And then we provide an efficient fuzzy attributed graph algorithm based on the solution to subgraph isomorphism for the subcircuit extraction problem. Similarity measurement makes a significant contribution to both the subgraph isomorphism problem and the subcircuit extraction problem.
Keywords :
VLSI; circuit layout CAD; circuit simulation; fuzzy set theory; graph theory; isomorphism; VLSI testing; circuit partition; efficient fuzzy attributed graph algorithm; fuzzy graph matching problem; image understanding; layout versus schematic check; pattern recognition; subcircuit extraction problem; subgraph isomorphism; Application software; Circuit testing; Computational intelligence; Electronics industry; Fuzzy sets; Partitioning algorithms; Pattern matching; Pattern recognition; Semiconductor device manufacture; Very large scale integration;
Conference_Titel :
Fuzzy Systems, 2003. FUZZ '03. The 12th IEEE International Conference on
Print_ISBN :
0-7803-7810-5
DOI :
10.1109/FUZZ.2003.1206579