• DocumentCode
    1564293
  • Title

    "Confluence of Design, Manufacturing and Test: Demystifying Yield"

  • Author

    Williams, T.W.

  • Author_Institution
    Fellow, Synopsys, Inc.
  • fYear
    2008
  • Firstpage
    52
  • Lastpage
    52
  • Keywords
    Automatic testing; Books; Built-in self-test; Circuit testing; Computer Society; Design automation; Design for testability; Logic testing; Manufacturing; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference, 2008. ASMC 2008. IEEE/SEMI
  • Conference_Location
    Cambridge, MA, USA
  • ISSN
    1078-8743
  • Print_ISBN
    978-1-4244-1964-7
  • Electronic_ISBN
    1078-8743
  • Type

    conf

  • DOI
    10.1109/ASMC.2008.4529006
  • Filename
    4529006
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1564293