Title :
"Confluence of Design, Manufacturing and Test: Demystifying Yield"
Author_Institution :
Fellow, Synopsys, Inc.
Keywords :
Automatic testing; Books; Built-in self-test; Circuit testing; Computer Society; Design automation; Design for testability; Logic testing; Manufacturing; Very large scale integration;
Conference_Titel :
Advanced Semiconductor Manufacturing Conference, 2008. ASMC 2008. IEEE/SEMI
Conference_Location :
Cambridge, MA, USA
Print_ISBN :
978-1-4244-1964-7
Electronic_ISBN :
1078-8743
DOI :
10.1109/ASMC.2008.4529006
