DocumentCode :
1564453
Title :
A Novel Advanced Process Control for Semiconductor Manufacturing: Dual Proximate Inverse System Feedback Control
Author :
Hua, Sheng ; Cheng, Xiu-Lan ; Jin, Tong-Dan
Author_Institution :
Sch. of Microelectron., Shanghai Jiao Tong Univ., Shanghai
fYear :
2008
Firstpage :
167
Lastpage :
172
Abstract :
Advanced process control (APC) is very important to improve throughput, yield and performance of products in modern semiconductor manufacturing. It is difficult for conventional APC to reduce error automatically and effectively. A novel anti-systematic-error APC: dual proximate inverse system feedback control (DIFC), which can perform better than classical inverse feedback control, is proposed. It can cooperate with other feedback APC or classical methods to decrease systematic error. Sufficient condition that makes DIFC asymptotically stable and convergent to target output is given and proved. DIFC is simulated using several virtual semiconductor tools, e.g. RTP, ion implanter and CMP tool. Different control laws and inverse system models are used in these simulations. The study shows that DIFC can deal with systematical error continuous (during manufacturing) step (after maintenance). DIFC do reduce these errors by several orders of magnitude rapidly.
Keywords :
ion implantation; process control; semiconductor device manufacture; advanced process control; dual proximate inverse system feedback control; error reduction; inverse feedback control; ion implanter; semiconductor manufacturing; systematical error continuous; virtual semiconductor tools; Automatic control; Control systems; Error correction; Feedback control; MIMO; Manufacturing processes; Process control; Semiconductor device manufacture; Stability; Throughput; Advanced Process Control; Dual Proximate Inverse System Feedback Control; Inverse Control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Manufacturing Conference, 2008. ASMC 2008. IEEE/SEMI
Conference_Location :
Cambridge, MA
ISSN :
1078-8743
Print_ISBN :
978-1-4244-1964-7
Electronic_ISBN :
1078-8743
Type :
conf
DOI :
10.1109/ASMC.2008.4529023
Filename :
4529023
Link To Document :
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