Title :
Structural and luminescent properties of terbium doped strontium titanate xerogel
Author :
Rudenko, M.V. ; Gaponenko, N.V. ; Mydryi, A.V.
Author_Institution :
Belarusian State Univ. of Inf. & Radioelectron., Minsk, Belarus
Abstract :
We report on synthesis and photoluminescence of sol-gel derived terbium doped strontium titanate on monocrystalline silicon and in the porous anodic alumina matrix. The microstructure and morphology of the samples are analyzed by X-ray diffraction and scanning electron microscope analyses. The thickness of the spin-on films deposited on silicon is about 115 and 170 nm due to the annealing temperature 750 and 1000 °C respectively. The samples reveal terbium luminescence in the visible range.
Keywords :
X-ray diffraction; aerogels; alumina; annealing; crystal microstructure; crystal morphology; doping; elemental semiconductors; photoluminescence; scanning electron microscopy; silicon; sol-gel processing; strontium compounds; terbium; thin films; Al2O3; Si; SrTiO3:Tb; X-ray diffraction; annealing temperature; luminescent properties; microstructure; monocrystalline silicon; morphology; photoluminescence; porous anodic alumina matrix; scanning electron microscope; sol-gel derived terbium doped strontium titanate; spin-on films deposition; structural properties; temperature 1000 degC; temperature 750 degC; terbium doped strontium titanate xerogel; Manganese;
Conference_Titel :
Microwave & Telecommunication Technology (CriMiCo), 2014 24th International Crimean Conference
Conference_Location :
Sevastopol
Print_ISBN :
978-966-335-412-5
DOI :
10.1109/CRMICO.2014.6959631
