DocumentCode :
156473
Title :
The calculation of the current-voltage characteristics of vacuum EHF nanoelectronics structures
Author :
Davidovich, M.V. ; Bushuev, N.A.
Author_Institution :
Chernyshevsky Saratov State Univ., Saratov, Russia
fYear :
2014
fDate :
7-13 Sept. 2014
Firstpage :
811
Lastpage :
812
Abstract :
The tunneling (cold emission) across potential barriers of complex forms, including those for structures with multiple electrodes, is theoretically studied. The volt-ampere characteristics (VAC) of diode and triode structures of vacuum nanoelectronics are presented.
Keywords :
diodes; nanoelectronics; triodes; tunnelling; vacuum microelectronics; cold emission; current-voltage characteristics; vacuum EHF nanoelectronics structures; TV;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave & Telecommunication Technology (CriMiCo), 2014 24th International Crimean Conference
Conference_Location :
Sevastopol
Print_ISBN :
978-966-335-412-5
Type :
conf
DOI :
10.1109/CRMICO.2014.6959643
Filename :
6959643
Link To Document :
بازگشت