Title :
Radiation effects in phase-locked loop
Author :
Elesin, Vadim V. ; Kuznetsov, Alexander G. ; Sotskov, D.I.
Author_Institution :
Moscow Eng. Phys. Inst., Nat. Res. Nucl. Univ. MEPhI, Moscow, Russia
Abstract :
An analysis of total dose and dose rate effects in phase-locked loop (PLL) ICs is presented. New radiation hardness test results for a variety of commercial and experimental PLL ICs are obtained.
Keywords :
phase locked loops; radiation hardening (electronics); dose rate effects; phase locked loop; radiation effects; radiation hardness test; CMOS integrated circuits;
Conference_Titel :
Microwave & Telecommunication Technology (CriMiCo), 2014 24th International Crimean Conference
Conference_Location :
Sevastopol
Print_ISBN :
978-966-335-412-5
DOI :
10.1109/CRMICO.2014.6959664
