• DocumentCode
    156513
  • Title

    Single event effects in RF and microwave ICs

  • Author

    Chukov, George V. ; Elesin, Vadim V. ; Boychenko, Dmitry V. ; Kuznetsov, Alexander G. ; Amburkin, Konstantin M.

  • Author_Institution
    Moscow Eng. Phys. Inst., Nat. Res. Nucl. Univ. MEPhI, Moscow, Russia
  • fYear
    2014
  • fDate
    7-13 Sept. 2014
  • Firstpage
    860
  • Lastpage
    861
  • Abstract
    The present paper presents an overview and an analysis of single event effects (SEE) for a variety of RF and microwave ICs. New SEE test results obtained at the NRNU MEPhI test center have been used along with the published data.
  • Keywords
    microwave integrated circuits; radiation hardening (electronics); RF IC; SEE test results; microwave IC; single event effects; Microwave integrated circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave & Telecommunication Technology (CriMiCo), 2014 24th International Crimean Conference
  • Conference_Location
    Sevastopol
  • Print_ISBN
    978-966-335-412-5
  • Type

    conf

  • DOI
    10.1109/CRMICO.2014.6959665
  • Filename
    6959665
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=156513