DocumentCode
1565377
Title
Reflectometry based on two-photon absorption of a silicon avalanche photodiode
Author
Tanaka, Y. ; Chua, P.G. ; Kurokawa, T. ; Tsuda, H. ; Naganuma, M. ; Takeda, M.
Author_Institution
Tokyo Univ. of Agric. & Technol., Koganei, Japan
fYear
2002
Firstpage
577
Abstract
Proposed and demonstrated a novel reflectometry system based on two-photon absorption process in a silicon photodetector. This method can measure the optical path difference of several millimeters to several meters with a simple system configuration. The study on improving the accuracy and resolution is currently under investigation. We also plan to apply the same method to measuring the surface shape of objects using the two-photon absorption of silicon image sensors.
Keywords
avalanche photodiodes; infrared detectors; reflectometry; two-photon processes; Si; accuracy; avalanche photodiode; optical path difference; reflectometry system; resolution; surface shape; two-photon absorption; Absorption; Amplitude modulation; Avalanche photodiodes; Optical modulation; Optical signal processing; Photoconductivity; Photodetectors; Pulse measurements; Reflectometry; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Optical Fiber Sensors Conference Technical Digest, 2002. Ofs 2002, 15th
Conference_Location
Portland, OR, USA
Print_ISBN
0-7803-7289-1
Type
conf
DOI
10.1109/OFS.2002.1000807
Filename
1000807
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