Title :
Temperature-aware microarchitecture
Author :
Skadron, Kevin ; Stan, Mircea R. ; Huang, Wei ; Velusamy, Sivakumar ; Sankaranarayanan, Karthik ; Tarjan, David
Author_Institution :
Dept. of Comput. Sci., Virginia Univ., Charlottesville, VA, USA
Abstract :
With power density and hence cooling costs rising exponentially, processor packaging can no longer be designed for the worst case, and there is an urgent need for runtime processor-level techniques that can regulate operating temperature when the package\´s capacity is exceeded. Evaluating such techniques, however, requires a thermal model that is practical for architectural studies. We describe HotSpot, an accurate yet fast model based on an equivalent circuit of thermal resistances and capacitances that correspond to microarchitecture blocks and essential aspects of the thermal package. Validation was performed using finite-element simulation. We also introduce several effective methods for dynamic thermal management (DTM): "temperature-tracking" frequency scaling, localized toggling, and migrating computation to spare hardware units. Modeling temperature at the microarchitecture level also shows that power metrics are poor predictors of temperature, and that sensor imprecision has a substantial impact on the performance of DTM.
Keywords :
cooling; finite element analysis; heat sinks; integrated circuit packaging; microprocessor chips; power engineering computing; temperature measurement; temperature sensors; thermal management (packaging); dynamic thermal management; finite element simulation; frequency scaling; hotspot thermal model; localized toggling; power-performance simulator; real-time temperature sensor; spare hardware unit computation; temperature tracking; temperature-aware microarchitecture; Capacitance; Cooling; Costs; Equivalent circuits; Microarchitecture; Packaging; Runtime; Temperature sensors; Thermal management; Thermal resistance;
Conference_Titel :
Computer Architecture, 2003. Proceedings. 30th Annual International Symposium on
Print_ISBN :
0-7695-1945-8
DOI :
10.1109/ISCA.2003.1206984