• DocumentCode
    156571
  • Title

    A 1.5GHz all-digital frequency-locked loop with 1-bit ΔΣ frequency detection in 0.18μm CMOS

  • Author

    Huiying Zhuo ; Yu Li ; Woogeun Rhee ; Zhihua Wang

  • Author_Institution
    Inst. of Microelectron., Tsinghua Univ., Beijing, China
  • fYear
    2014
  • fDate
    28-30 April 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A 1.5 GHz all-digital fractional-N frequency-locked loop by utilizing a ΔΣ frequency-to-digital converter (FDC) is implemented in 0.18 μm CMOS. Different from the conventional all-digital phase-locked loop, the all-digital frequency-locked loop (ADFLL) with a 1-bit ΔΣ frequency detector (FD) avoids complex time-to-digital converter (TDC) design and achieves a fine frequency resolution with bi-level oversampled frequency detection, thus enabling low-cost high-frequency synthesis without requiring an advanced CMOS technology. A finite impulse response (FIR) filter is designed to reduce quantization noise from the ΔΣ FDC and provides highly linear loop dynamics in the type-I feedback system. Experimental results show that the proposed ADFLL at 1.4 GHz output achieves a phase noise of -118 dBc/Hz at a 1 MHz offset frequency, consuming 7.3 mW from a 1.8 V supply.
  • Keywords
    CMOS integrated circuits; FIR filters; delta-sigma modulation; frequency convertors; frequency locked loops; phase noise; quantisation (signal); ΔΣ frequency detection; ΔΣ frequency-to-digital converter; ADFLL; CMOS technology; FDC; FIR filter; all-digital fractional-N frequency-locked loop; fine frequency resolution; finite impulse response filter; frequency 1 MHz; frequency 1.4 GHz; frequency 1.5 GHz; high-frequency synthesis; highly linear loop dynamics; phase noise; power 7.3 mW; quantization noise; size 0.18 mum; storage capacity 1 bit; type-I feedback system; voltage 1.8 V; CMOS integrated circuits; Finite impulse response filters; Frequency locked loops; Frequency modulation; Frequency synthesizers; Phase locked loops; Quantization (signal);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, Automation and Test (VLSI-DAT), 2014 International Symposium on
  • Conference_Location
    Hsinchu
  • Type

    conf

  • DOI
    10.1109/VLSI-DAT.2014.6834880
  • Filename
    6834880