• DocumentCode
    1565777
  • Title

    Resistivity reliability of tunneling magnetoresistive heads

  • Author

    Seongtae Bae ; I-Fei Tsu ; Davis, M. ; Nowak, J.J. ; Judy, J.H.

  • Author_Institution
    University of Minnesota
  • fYear
    2002
  • Firstpage
    168
  • Lastpage
    168
  • Abstract
    Summary form only given. The electrical reliability of tunneling magnetoresistive (TMR) read heads has been investigated in terms of breakdown voltage[ 11 and electrical open failures[2] under constant biasing-current. The breakdown voltage is strongly dependent on duration of the applied voltage step, and ambient temperature.
  • Keywords
    Conductivity; Frequency; Magnetic field measurement; Magnetic heads; Magnetic noise; Magnetic sensors; Noise figure; Noise measurement; Temperature sensors; Tunneling magnetoresistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
  • Conference_Location
    Amsterdam, The Netherlands
  • Print_ISBN
    0-7803-7365-0
  • Type

    conf

  • DOI
    10.1109/INTMAG.2002.1000844
  • Filename
    1000844
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1565777