DocumentCode
156582
Title
Analysis of differential entropy at two-parameter technical measurements
Author
Kopp, V.Ya. ; Balakin, A.I. ; Chuyko, E.A. ; Zori, A.A.
Author_Institution
Sevastopol Nat. Tech. Univ., Sevastopol, Russia
fYear
2014
fDate
7-13 Sept. 2014
Firstpage
946
Lastpage
947
Abstract
The questions of improving the accuracy of measuring equipment are considered. The present paper concerns the theorem on the maximum of differential entropy of the two-dimensional random variable bounded finite limits with its defined mathematical expectation, variance and correlation moments.
Keywords
mathematical analysis; maximum entropy methods; accuracy improvement; correlation moments; defined mathematical expectation; maximum differential entropy analysis; measuring equipment; two-dimensional random variable bounded finite limits; two-parameter technical measurements; variance moments; Committees; Communications technology; Entropy; IEEE catalog; Microwave measurement; Microwave technology; Organizing;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave & Telecommunication Technology (CriMiCo), 2014 24th International Crimean Conference
Conference_Location
Sevastopol
Print_ISBN
978-966-335-412-5
Type
conf
DOI
10.1109/CRMICO.2014.6959707
Filename
6959707
Link To Document