• DocumentCode
    1565820
  • Title

    CH003: Stability of nanodots in ferroelectric thin films

  • Author

    Balke, N. ; Yu, Paul ; Wang, L.-P. ; Ramesh, Ramaswamy

  • Author_Institution
    Department of Materials Science and Engineering, University of California Berkeley, 100 Hearst Memorial Mining Building, 94720, USA
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Retention properties of written nanodots for Pb(Zr0.2Ti0.8)O3 have been investigated. The imaging voltage plays an important role when investigating small unstable domains. Even with an imaging voltage far below the coercive voltage the boundaries of the domains are switched during imaging by what the measured nanodomain stability is strongly influenced
  • Keywords
    Atomic force microscopy; Ferroelectric materials; Performance evaluation; Piezoelectric films; Pulse measurements; Pulsed laser deposition; Stability; Transistors; Voltage; Writing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 2008. ISAF 2008. 17th IEEE International Symposium on the
  • Conference_Location
    Santa Re, NM, USA
  • ISSN
    1099-4734
  • Print_ISBN
    978-1-4244-2744-4
  • Electronic_ISBN
    1099-4734
  • Type

    conf

  • DOI
    10.1109/ISAF.2008.4688111
  • Filename
    4688111
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1565820