Title :
Time-resolved characterization of domain switching in ferroelectrics using X-ray and neutron diffraction
Author :
Jones, J. L. ; Pramanick, A. ; Daniels, J. E.
Author_Institution :
Department of Materials Science and Engineering, University of Florida, PO Box 116400, Gainesville, 32611-6400, USA
Abstract :
Diffraction provides an effective means to characterize ferroelectric materials under dynamic loading conditions. This paper describes a typical time-resolved diffraction setup and one example of a time-dependent strain response to an applied electric field in a piezoelectric lead zirconate titanate (PZT) ceramic.
Keywords :
Capacitive sensors; Ceramics; Electric variables measurement; Ferroelectric materials; Lattices; Neutrons; Reflection; Strain measurement; Time measurement; X-ray diffraction;
Conference_Titel :
Applications of Ferroelectrics, 2008. ISAF 2008. 17th IEEE International Symposium on the
Conference_Location :
Santa Re, NM, USA
Print_ISBN :
978-1-4244-2744-4
Electronic_ISBN :
1099-4734
DOI :
10.1109/ISAF.2008.4688115
