DocumentCode :
1566022
Title :
BER estimation from synchronous sample statistics
Author :
Nan-Hsiung Yeh ; Abdelnour, G. ; Horng-Shiong Chen
Author_Institution :
Seagate Technol., Fremont, CA, USA
fYear :
2002
Abstract :
Summary form only given. Bit-by-bit simulation requires the capture of at least 10-100 errors to obtain statistically meaningful BER readings. Several Gigabits of user data are needed when the BER is low. By analyzing statistics of synchronous samples, a few sectors of data (or 5-50 kbits) are sufficient to predict BER with no range limit. In a PRML (partial response maximum likelihood) channel, statistics of sequence metrics at the Viterbi detection point can be derived from synchronous samples and directly correlated to the BER. We found the BER is usually over-estimated if a Gaussian shaped error histogram is assumed.
Keywords :
Viterbi detection; correlation methods; digital magnetic recording; error analysis; error statistics; hard discs; maximum likelihood detection; partial response channels; sampling methods; synchronisation; 5 to 50 kbit; BER correlation; BER estimation; BER prediction range limit; Gaussian shaped error histogram; PRML channel; Viterbi detection point; bit error rate; bit-by-bit simulation; data sectors; digital magnetic recording; error capture; hard disk drives; partial response maximum likelihood channel; sequence metric statistics; statistically meaningful BER readings; synchronous sample statistics; synchronous sample statistics analysis; user data sampling; Bit error rate; Error analysis; Inductance; Magnetic heads; Nonlinear distortion; Sampling methods; Statistical analysis; Statistics; Viterbi algorithm; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
Conference_Location :
Amsterdam, The Netherlands
Print_ISBN :
0-7803-7365-0
Type :
conf
DOI :
10.1109/INTMAG.2002.1000866
Filename :
1000866
Link To Document :
بازگشت