• DocumentCode
    1566049
  • Title

    CH027

  • Author

    Han, Yi ; Reaney, I. M. ; Johnson, R. ; Telli, M. B. ; Tinberg, D. S. ; Levin, Ines ; Trolier-McKinstry, Susan

  • Author_Institution
    Department of Engineering Materials, University of Sheffield, Sir Robert Hadfield Building, Mappin Street, S1 3JD, United Kingdom
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Epitaxial AgTa0.5Nb0.5O3 (ATN) films deposited on (001)p SrRuO3/LaAlO3 and LaAlO3 by a chemical solution deposition technique have been characterised by transmission electron microscopy. The structure of the ATN layers has been compared with equivalent bulk ceramics. For thin ATN films, only superstructure reflections at ½{ooo} positions were observed, consistent with a structure tilted in antiphase only. In contrast, bulk ATN showed ±¼(00l) reflections which result from a combination of in-phase and antiphase tilting along the c axis as well as antiparallel cation displacements.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 2008. ISAF 2008. 17th IEEE International Symposium on the
  • Conference_Location
    Santa Re, NM, USA
  • ISSN
    1099-4734
  • Print_ISBN
    978-1-4244-2744-4
  • Electronic_ISBN
    1099-4734
  • Type

    conf

  • DOI
    10.1109/ISAF.2008.4688133
  • Filename
    4688133
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1566049