Title :
Experimental error rates in a PRML channel versus asymmetry
Author :
Feng, Jianjiang ; Whittier, T.
Author_Institution :
EBM Storage Technol. Div., San Jose, CA, USA
Abstract :
Summary form only given. One of the most obvious distortions produced by a magnetoresistive transducer is the polarity-dependent asymmetry in its readback signal. The effects of these transfer-curve distortions on the error rate were determined experimentally using a single head and disk to minimize any confounding effects due to other normal head-to-head variations such as sensitivity and resolution. The distortion was varied by changing the bias current from 3.0 mA to 6.0 mA and by applying /spl plusmn/100 Oe external magnetic fields to produce a /spl plusmn/40% range of amplitude asymmetries. The recorded channel bit density was varied from 1.8 to 3.3 by changing the linear density from 240 kbpi to 440 kbpi, and the complex data patterns were decoded using an IBM PRML channel operating at a channel clock rate of about 280 Mbits/sec.
Keywords :
decoding; digital magnetic recording; error statistics; hard discs; magnetic field effects; magnetoresistive devices; maximum likelihood detection; nonlinear distortion; partial response channels; 280 Mbit/s; 3 to 6 mA; PRML channels; amplitude asymmetry range; channel clock rate; complex data pattern decoding; experimental error rates; external magnetic field application; hard disk; head bias current; head-to-head variations; linear density; magnetic read head; magnetic recording; magnetoresistive transducer distortions; partial response maximum likelihood channels; readback signal polarity-dependent asymmetry; recorded channel bit density; resolution variations; sensitivity variations; transfer-curve distortion effects; Algorithm design and analysis; Bit error rate; Design optimization; Error analysis; Evolutionary computation; Magnetic heads; Magnetic recording; Robustness; Sampling methods; Space vector pulse width modulation;
Conference_Titel :
Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
Conference_Location :
Amsterdam, The Netherlands
Print_ISBN :
0-7803-7365-0
DOI :
10.1109/INTMAG.2002.1000869