DocumentCode :
1566267
Title :
Dependence of thermo-magnetic mark size on applied STM voltage in Co/Pt multilayers
Author :
Li Zhang ; Bain, James A. ; Jian-Gang Zhu
Author_Institution :
Data Storage Syst. Center, Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear :
2002
Abstract :
Summary form only given. We present characterization of a magnetic recording process potentially suitable for proposed probe-based storage systems. A scanning tunneling microscope (STM) is used to locally heat a uniformly magnetized perpendicular recording medium. In this work, a 10 nm thick Co/Pt multilayer thin film was used as the recording medium. Pulsed heating of the medium was done using the STM mode of a DI Nanoscope III. Detailed measurement of mark size vs. pulse amplitude (tip-sample spacing controlled at 20 mV bias and 2 nA of tunneling current) shows a relatively constant mark diameter of about 220 nm (theoretical calculation shows the minimum stable domain size for Co/Pt is /spl sim/100 nm), when the voltage is above a threshold of 2 V. This result contradicts previous results by J. Nakamura et al. (see J. Appl. Phys., vol. 77, p. 779-781, 1995), which showed increasing mark size with increasing applied voltage. By using a model of field emission from an STM, we suggest this discrepancy is due to the change in tip-sample spacing during writing due to reaction of the mechanical system. The threshold phenomenon may be due to the threshold of domain nucleation and breakdown current to follow through.
Keywords :
cobalt; field emission; multilayers; platinum; scanning tunnelling microscopy; thermomagnetic recording; 100 nm; 2 V; 2 nA; 20 mV; 220 nm; Co-Pt; Co/Pt multilayer thin film; STM; applied STM voltage; breakdown current; domain nucleation; field emission model; magnetic recording process characterization; probe-based storage systems; recording medium local heating; scanning tunneling microscope; thermo-magnetic mark size dependence; threshold phenomenon; tip-sample spacing variation; uniformly magnetized perpendicular recording medium; writing process; Heating; Magnetic force microscopy; Magnetic multilayers; Magnetic recording; Nonhomogeneous media; Perpendicular magnetic recording; Size measurement; Transistors; Tunneling; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
Conference_Location :
Amsterdam, The Netherlands
Print_ISBN :
0-7803-7365-0
Type :
conf
DOI :
10.1109/INTMAG.2002.1000889
Filename :
1000889
Link To Document :
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