Moment reduction due to oxygen contamination of Fe/sub 35/Co/sub 65/

Author

Yu, Weimin ; Bain, James A. ; Yingguo Peng ; Laughlin, David E.

Author_Institution

Data Storage Syst. Center, Carnegie Mellon Univ., Pittsburgh, PA, USA

fYear

2002

Abstract

Summary form only given. Obtaining high moment sputtered thin films with soft properties requires small grains with good exchange coupling between the grains. Contamination of grain boundaries during deposition will significantly degrade magnetic softness and reduce magnetic moment. In this work, we report on such contamination induced by substrate bias during sputter deposition of Fe/sub 35/Co/sub 65/ films.

Keywords

cobalt alloys; exchange interactions (electron); ferromagnetic materials; grain boundaries; iron alloys; magnetic moments; magnetic thin films; soft magnetic materials; sputter deposition; surface contamination; Fe/sub 35/Co/sub 65/; Fe/sub 35/Co/sub 65/:O; exchange coupling; films; grain boundaries; high moment sputtered thin films; magnetic moment; magnetic softness; moment reduction; oxygen contamination; small grains; soft properties; sputter deposition; substrate bias; Argon; Contamination; Diffraction; Grain size; Iron; Loss measurement; Microstructure; Oxygen; Thickness measurement; Volume measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International

Conference_Location

Amsterdam, The Netherlands

Print_ISBN

0-7803-7365-0

Type

conf

DOI

10.1109/INTMAG.2002.1000905

Filename

1000905