Title :
Moment reduction due to oxygen contamination of Fe/sub 35/Co/sub 65/
Author :
Yu, Weimin ; Bain, James A. ; Yingguo Peng ; Laughlin, David E.
Author_Institution :
Data Storage Syst. Center, Carnegie Mellon Univ., Pittsburgh, PA, USA
Abstract :
Summary form only given. Obtaining high moment sputtered thin films with soft properties requires small grains with good exchange coupling between the grains. Contamination of grain boundaries during deposition will significantly degrade magnetic softness and reduce magnetic moment. In this work, we report on such contamination induced by substrate bias during sputter deposition of Fe/sub 35/Co/sub 65/ films.
Keywords :
cobalt alloys; exchange interactions (electron); ferromagnetic materials; grain boundaries; iron alloys; magnetic moments; magnetic thin films; soft magnetic materials; sputter deposition; surface contamination; Fe/sub 35/Co/sub 65/; Fe/sub 35/Co/sub 65/:O; exchange coupling; films; grain boundaries; high moment sputtered thin films; magnetic moment; magnetic softness; moment reduction; oxygen contamination; small grains; soft properties; sputter deposition; substrate bias; Argon; Contamination; Diffraction; Grain size; Iron; Loss measurement; Microstructure; Oxygen; Thickness measurement; Volume measurement;
Conference_Titel :
Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
Conference_Location :
Amsterdam, The Netherlands
Print_ISBN :
0-7803-7365-0
DOI :
10.1109/INTMAG.2002.1000905
