• DocumentCode
    156654
  • Title

    Practical electrical parameter aware methodology for analog designers with emphasis on LDE aware for devices

  • Author

    Hau-Yung Chen ; Ming Juan ; Hsin-Hao Chen ; Guan, Arvin

  • Author_Institution
    Synopsys, Mountain View, CA, USA
  • fYear
    2014
  • fDate
    28-30 April 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The device layout structure has proven to have profound effects to its electrical characteristics for advanced technology nodes, which, if not taken into account during the design cycle, will have devastating impact to the circuit functionality. A new design methodology is presented in this paper, which can help circuit designers identify early in the design stage the performance implication due to shift of critical device instance parameters from its layout.
  • Keywords
    analogue integrated circuits; integrated circuit layout; LDE aware; analog designers; circuit functionality; device layout structure; electrical characteristics; electrical parameter aware methodology; layout dependent effect; Foundries; Layout; Noise; Performance evaluation; Routing; Wiring; Analog Desig; Design Methodology; Device Characteristics; Electrical Parameters; LDE; Layout Effect;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, Automation and Test (VLSI-DAT), 2014 International Symposium on
  • Conference_Location
    Hsinchu
  • Type

    conf

  • DOI
    10.1109/VLSI-DAT.2014.6834922
  • Filename
    6834922