DocumentCode
156654
Title
Practical electrical parameter aware methodology for analog designers with emphasis on LDE aware for devices
Author
Hau-Yung Chen ; Ming Juan ; Hsin-Hao Chen ; Guan, Arvin
Author_Institution
Synopsys, Mountain View, CA, USA
fYear
2014
fDate
28-30 April 2014
Firstpage
1
Lastpage
4
Abstract
The device layout structure has proven to have profound effects to its electrical characteristics for advanced technology nodes, which, if not taken into account during the design cycle, will have devastating impact to the circuit functionality. A new design methodology is presented in this paper, which can help circuit designers identify early in the design stage the performance implication due to shift of critical device instance parameters from its layout.
Keywords
analogue integrated circuits; integrated circuit layout; LDE aware; analog designers; circuit functionality; device layout structure; electrical characteristics; electrical parameter aware methodology; layout dependent effect; Foundries; Layout; Noise; Performance evaluation; Routing; Wiring; Analog Desig; Design Methodology; Device Characteristics; Electrical Parameters; LDE; Layout Effect;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, Automation and Test (VLSI-DAT), 2014 International Symposium on
Conference_Location
Hsinchu
Type
conf
DOI
10.1109/VLSI-DAT.2014.6834922
Filename
6834922
Link To Document