• DocumentCode
    156656
  • Title

    Highly automated and efficient simulation environment with UVM

  • Author

    Hung-Yi Yang

  • fYear
    2014
  • fDate
    28-30 April 2014
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    As design becomes more and more complicated, functional verification is getting challenging than ever. The challenges come in twofold: verification is taking longer to finish and difficult to catch all functional errors. Surveys[1] shown that functional error has been the number one reason for re-spin. How well verification is done becomes a very important issue. Re-spin not only can cost a lot due to advancing of manufacturing process but also delays the time to market which could be even more costly than re-spin itself. In order to tackle these two challenges, industry has come up with a solution called Universal Verification Methodology (UVM)[2] in recent years. But even with UVM which standardized the way for designing testbench, a simulation environment has to be well designed to take advantage of UVM and provide management of running large amount of simulations/regression in an efficient way.
  • Keywords
    design engineering; formal verification; test facilities; time to market; UVM; functional verification; highly automated simulation environment; time to market; universal verification methodology; Data models; Decoding; Industries; Protocols; Receivers; Streaming media; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, Automation and Test (VLSI-DAT), 2014 International Symposium on
  • Conference_Location
    Hsinchu
  • Type

    conf

  • DOI
    10.1109/VLSI-DAT.2014.6834923
  • Filename
    6834923