DocumentCode
156656
Title
Highly automated and efficient simulation environment with UVM
Author
Hung-Yi Yang
fYear
2014
fDate
28-30 April 2014
Firstpage
1
Lastpage
3
Abstract
As design becomes more and more complicated, functional verification is getting challenging than ever. The challenges come in twofold: verification is taking longer to finish and difficult to catch all functional errors. Surveys[1] shown that functional error has been the number one reason for re-spin. How well verification is done becomes a very important issue. Re-spin not only can cost a lot due to advancing of manufacturing process but also delays the time to market which could be even more costly than re-spin itself. In order to tackle these two challenges, industry has come up with a solution called Universal Verification Methodology (UVM)[2] in recent years. But even with UVM which standardized the way for designing testbench, a simulation environment has to be well designed to take advantage of UVM and provide management of running large amount of simulations/regression in an efficient way.
Keywords
design engineering; formal verification; test facilities; time to market; UVM; functional verification; highly automated simulation environment; time to market; universal verification methodology; Data models; Decoding; Industries; Protocols; Receivers; Streaming media; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, Automation and Test (VLSI-DAT), 2014 International Symposium on
Conference_Location
Hsinchu
Type
conf
DOI
10.1109/VLSI-DAT.2014.6834923
Filename
6834923
Link To Document