• DocumentCode
    1566696
  • Title

    A statistical model to locate faults at input levels

  • Author

    Ji, Wu ; Xiao-xia, Jia ; Chang, Liu ; Hai-yan, Yang ; Chao, Liu ; Mao-Zhong, Jin

  • Author_Institution
    Beijing Univ. of Aeronaut. & Astronaut., China
  • fYear
    2004
  • Firstpage
    274
  • Lastpage
    277
  • Abstract
    We present a statistical model to locate faults at the input level based on the failure patterns and the success patterns. The model neither needs to be fed with software module, code or trace information, nor does it require re-executing the program. To evaluate the model, precision and recall are adopted as the criteria. Five programs are examined and 17 testing experiments are conducted in which the model gains 0.803 in precision and 0.697 in recall on average.
  • Keywords
    program testing; program verification; software fault tolerance; statistical analysis; failure patterns; model evaluation; software module; statistical model; success patterns; Chaos; Computer bugs; Debugging; Fault location; Software engineering; Software testing; Visualization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Automated Software Engineering, 2004. Proceedings. 19th International Conference on
  • ISSN
    1938-4300
  • Print_ISBN
    0-7695-2131-2
  • Type

    conf

  • DOI
    10.1109/ASE.2004.1342745
  • Filename
    1342745