DocumentCode
1566696
Title
A statistical model to locate faults at input levels
Author
Ji, Wu ; Xiao-xia, Jia ; Chang, Liu ; Hai-yan, Yang ; Chao, Liu ; Mao-Zhong, Jin
Author_Institution
Beijing Univ. of Aeronaut. & Astronaut., China
fYear
2004
Firstpage
274
Lastpage
277
Abstract
We present a statistical model to locate faults at the input level based on the failure patterns and the success patterns. The model neither needs to be fed with software module, code or trace information, nor does it require re-executing the program. To evaluate the model, precision and recall are adopted as the criteria. Five programs are examined and 17 testing experiments are conducted in which the model gains 0.803 in precision and 0.697 in recall on average.
Keywords
program testing; program verification; software fault tolerance; statistical analysis; failure patterns; model evaluation; software module; statistical model; success patterns; Chaos; Computer bugs; Debugging; Fault location; Software engineering; Software testing; Visualization;
fLanguage
English
Publisher
ieee
Conference_Titel
Automated Software Engineering, 2004. Proceedings. 19th International Conference on
ISSN
1938-4300
Print_ISBN
0-7695-2131-2
Type
conf
DOI
10.1109/ASE.2004.1342745
Filename
1342745
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