Title :
Areal density process advantages for CPP sensors
Author :
Fontana, R.E. ; Katine, J.A. ; Cyrille, M.-C. ; Ho, Mantak ; Tsang, Cornelia ; Childress, J.
Author_Institution :
IBM Almaden Res. Center, San Jose, CA, USA
Abstract :
Summary form only given. This paper deals with a discussion of the process advantages of CPP geometry sensors for narrow trackwidth and narrow gap applications in thin film head read transducers. Simply stated, the CPP sensor geometry removes the CIP sensor processing requirement for thin insulating gaps and allows for precise confinement of current flow and hence magnetic trackwidth control.
Keywords :
digital magnetic recording; magnetic heads; magnetic sensors; magnetic thin film devices; tunnelling magnetoresistance; CIP sensor processing requirements; CPP geometry sensors; areal density process advantages; current flow precise confinement; current incident to plane sensors; current perpendicular to plane sensors; magnetic trackwidth control; narrow gap applications; narrow trackwidth applications; thin film head read transducers; thin insulating gaps; tunnel valve sensors; Conducting materials; Dielectric materials; Geometry; Insulation life; Magnetic confinement; Magnetic heads; Magnetic materials; Magnetic sensors; Magnetic shielding; Thin film sensors;
Conference_Titel :
Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
Conference_Location :
Amsterdam, The Netherlands
Print_ISBN :
0-7803-7365-0
DOI :
10.1109/INTMAG.2002.1000949
