Title : 
Torsional dependence of second harmonic amplitude of giant magnetoimpedance in FeCoSiB amorphous wire
         
        
            Author : 
Losin, C. ; Gomez-Polo, Cristina ; Knobel, M. ; Grishin, A.
         
        
            Author_Institution : 
Dept. de Fisica, Univ. Publica de Navarra, Pamplona, Spain
         
        
        
            Abstract : 
Summary form only given. The effect of torsional stresses in the magnetoimpedance response of a (Co/sub 0.94/Fe/sub 0.06/)/sub 72.5/Si/sub 12.5/B/sub 15/ amorphous wire (125 /spl mu/m and 5 cm in length) is analyzed in the present work. In particular, the occurrence of a second harmonic contribution of the magnetoimpedance voltage and its evolution upon the application of a torsional strain, /spl xi/, to the wire is analyzed and compared with the evolution of the first harmonic amplitude (impedance). The voltage drop across the sample and the current signal, obtained through a commercial current probe, were simultaneously recorded by a digital oscilloscope and analyzed through Fourier analysis. The experimental set-up enables the application of longitudinal magnetic fields by a long solenoid and the simultaneous application of torsional and tensile stresses to the sample.
         
        
            Keywords : 
Fourier analysis; amorphous magnetic materials; boron alloys; cobalt alloys; ferromagnetic materials; giant magnetoresistance; iron alloys; magnetoelastic effects; silicon alloys; (Co/sub 0.94/Fe/sub 0.06/)/sub 72.5/Si/sub 12.5/B/sub 15/; 125 micron; 5 cm; FeCoSiB amorphous wire; Fourier analysis; giant magnetoimpedance; longitudinal magnetic fields; second harmonic amplitude; torsional dependence; torsional stress effect; Amorphous magnetic materials; Amorphous materials; Harmonic analysis; Iron; Magnetic analysis; Magnetic field induced strain; Signal analysis; Stress; Voltage; Wire;
         
        
        
        
            Conference_Titel : 
Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
         
        
            Conference_Location : 
Amsterdam, The Netherlands
         
        
            Print_ISBN : 
0-7803-7365-0
         
        
        
            DOI : 
10.1109/INTMAG.2002.1000973