DocumentCode :
1567588
Title :
The capability test of electronic tag
Author :
Yiqun, Xu ; Longjun, Wan ; Dujiang, Chen
Author_Institution :
Marine Eng. Inst., Jimei Univ., Xiamen
fYear :
2008
Firstpage :
478
Lastpage :
480
Abstract :
This paper introduces problems of electronic tag in actual application and the essentiality of capability test for electronic tag. We have established a test platform which is based on radio frequency and worked out some related schemes, which has laid the experimental foundations for further researching environmental influence factor in electronic tag in future.
Keywords :
radiofrequency identification; RFID; electronic tag capability test; environmental influence factor; modular instrument; Automatic testing; Electronic equipment testing; Instruments; Marine technology; Radio frequency; Radiofrequency identification; Signal analysis; Signal generators; Standards development; System testing; capability test; electronic tag; modular instrument; test platform;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Anti-counterfeiting, Security and Identification, 2008. ASID 2008. 2nd International Conference on
Conference_Location :
Guiyang
Print_ISBN :
978-1-4244-2584-6
Electronic_ISBN :
978-1-4244-2585-3
Type :
conf
DOI :
10.1109/IWASID.2008.4688444
Filename :
4688444
Link To Document :
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