DocumentCode :
1567750
Title :
Feature extraction based on supervised kernel locality preserving projection algorithm and application to fault diagnosis
Author :
Wang, DeCheng ; Lin, Hui
Author_Institution :
Coll. of Autom., Northwest Polytech. Univ., Xi´´an, China
fYear :
2009
Abstract :
Fault redundancy information can increase computation complexity and reduce the precision of fault diagnosis. Feature extraction becomes very important to improve the performance of fault diagnosis. A supervised kernel learning algorithm based on manifold is presented to carry out feature extraction. The proposed algorithm firstly implements locality preserving projection in reproducing kernel Hilbert space. Using the quotient of between-class scatter matrix dividing within-class scatter matrix as discriminant criterion, it constructs feature space by selecting discriminant vector that reflects difference among classes. Discriminant vector that mainly reflects difference within classes is discarded. The proposed method is applied to fault diagnosis of switch open-circuit fault in brushless dc motor power converter, using proximal support vector machine classifier. Experimental result shows that the proposed algorithm has high diagnosis accuracy.
Keywords :
brushless DC motors; fault diagnosis; feature extraction; learning (artificial intelligence); support vector machines; between-class scatter matrix; brushless dc motor power converter; computation complexity; fault diagnosis; fault redundancy information; feature extraction; reproducing kernel Hilbert space; supervised kernel learning algorithm; supervised kernel locality preserving projection algorithm; support vector machine classifier; switch open-circuit fault; within-class scatter matrix; Brushless DC motors; Fault diagnosis; Feature extraction; Hilbert space; Kernel; Matrix converters; Projection algorithms; Redundancy; Scattering; Switches; Fault Diagnosis; Kernel Learning; Locality Preserving Projection; Proximal Support Vector Machine;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Measurement & Instruments, 2009. ICEMI '09. 9th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-3863-1
Electronic_ISBN :
978-1-4244-3864-8
Type :
conf
DOI :
10.1109/ICEMI.2009.5274804
Filename :
5274804
Link To Document :
بازگشت