• DocumentCode
    1567844
  • Title

    High temperature superconductor packaging technology

  • Author

    Wigand, John T.

  • fYear
    1992
  • Firstpage
    42638
  • Lastpage
    42641
  • Abstract
    The objective of using high-temperature superconductor (HTSC) interconnects in multichip module (MCM) substrates is to increase the functional performance to volume ratio above that of conventional MCMs. Functional performance is increased through the use of superconductive interconnect traces which allow ultra-high-speed transmissions between devices. Determining the exact operational characteristics of both the HTSC interconnect and the CMOS devices in a cryogenic environment is the initial requirement in building a HTSC MCM. Once they have been established, demonstration prototypes of the HTSC MCMs can begin to be built and tested. HTSC material requires an extremely cold (less than -150°C) cryogenic environment to become operational. This produces a unique challenge for the package design. The package must allow the flow of a cryogen through it, address electrical I/O, testability, and reliability, and survive many radically large temperature changes. Special attention to the coefficient of thermal expansion of the constituent materials is required to produce a consistently reliable design
  • Keywords
    Buildings; Cryogenics; High temperature superconductors; Materials reliability; Multichip modules; Packaging; Prototypes; Superconductivity; Testing; Thermal expansion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Telesystems Conference, 1992. NTC-92., National
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-7803-0554-X
  • Type

    conf

  • DOI
    10.1109/NTC.1992.267913
  • Filename
    267913