Abstract :
The following topics are dealt: radiation hardening; radiation damage in Hubble space telescope detectors; total-ionization dose effects on nonvolatile memory; proton radiation effects on PIN photodiodes for optical wireless links for intra-satellite communications; and total ionizing dose testing on semiconductor devices.
Keywords :
astronomical telescopes; field programmable gate arrays; integrated circuit testing; logic testing; optical communication equipment; optical links; optical testing; p-i-n photodiodes; proton effects; radiation hardening (electronics); random-access storage; satellite links; semiconductor device testing; space vehicle electronics; Hubble space telescope detectors; PIN photodiodes; Xilinx field programmable gate arrays; intra-satellite communications; nonvolatile memory; optical wireless links; proton radiation effects; radiation damage; radiation hardening; semiconductor devices; spacecraft electronics; total ionizing dose testing; total-ionization dose effects;
Conference_Titel :
Radiation Effects Data Workshop, 2007 IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-1464-2
DOI :
10.1109/REDW.2007.4342527
