DocumentCode
1568059
Title
A practice of ESL verification methodology from SystemC to FPGA - using EPC Class-1 Generation-2 RFID tag design as an example
Author
Young, W.M. ; Huang, Chua-Huang ; Su, Alan P. ; Jou, C.P. ; Hsueh, Fu-Lung
Author_Institution
TSMC, Hsinchu, Taiwan
fYear
2010
Firstpage
821
Lastpage
824
Abstract
This paper presents the first published industrial practice (to the best of our knowledge) to reuse high-level/C++ system simulation model through OSCI TLM 2.0 Library to verify its corresponding RTL implementation in FPGA. ESL verification methodology is employed in the design regression of EPC C1Gen2 RFID tag. Around 200 times speedup is observed using ESL over conventional RTL simulation in regression runs (after logic bug fixes). This clearly shows ESL verification is a successful candidate to reuse high-level test harness for IC functional verification, especially in today´s increasingly complex IC design world. On top of the successful use of the ESL functional verification flow on the design, we also show the infrastructure to use SystemC Verification Library (SCV) for formal verification. The functional and formal verification combined is thus the proposed ESL verification methodology.
Keywords
field programmable gate arrays; formal verification; integrated circuit design; logic design; logic simulation; radiofrequency identification; radiofrequency integrated circuits; EPC Class-1 Generation-2 RFID tag design; ESL verification methodology; FPGA; IC design; IC functional verification; OSCI TLM 2.0 Library; SystemC verification library; electronic system level; field programmable gate arrays; formal verification; high-level-C++ system simulation model; register transfer level; Circuit testing; Emulation; Field programmable gate arrays; Formal verification; Hardware design languages; Integrated circuit testing; Libraries; Programmable logic arrays; RFID tags; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference (ASP-DAC), 2010 15th Asia and South Pacific
Conference_Location
Taipei
Print_ISBN
978-1-4244-5765-6
Electronic_ISBN
978-1-4244-5767-0
Type
conf
DOI
10.1109/ASPDAC.2010.5419778
Filename
5419778
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