Title :
SEU Testing of a Multi-Gbps Fiber Optic Transceiver Operating Over Parallel Ribbon Fiber
Author :
Kuznia, C.B. ; Ahadian, J.F. ; Pommer, R.J. ; Hagan, R.
Author_Institution :
Ultra Commun., Inc., Vista
Abstract :
We present a multi-Gbps parallel fiber optic transceiver based on 850 nm GaAs vertical cavity surface emitting (VCSEL) and PIN optoelectronic devices and silicon-on-sapphire integrated circuitry. We present the results of heavy ion single event upset testing.
Keywords :
gallium arsenide; integrated optoelectronics; optical fibre communication; optical fibre testing; optical receivers; optical transmitters; p-i-n photodiodes; sapphire; silicon-on-insulator; surface emitting lasers; GaAs; GaAs vertical cavity surface emitting laser; PIN optoelectronic devices; SEU testing; Si-Al2O3; heavy ion single event upset testing; parallel fiber optic transceiver; silicon-on-sapphire integrated circuitry; wavelength 850 nm; Optical arrays; Optical crosstalk; Optical fiber devices; Optical fiber testing; Optical fibers; Optical receivers; Single event upset; Substrates; Transceivers; Vertical cavity surface emitting lasers;
Conference_Titel :
Radiation Effects Data Workshop, 2007 IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-1464-2
DOI :
10.1109/REDW.2007.4342546
