Title :
Optimizing blocks in an SoC using symbolic code-statement reachability analysis
Author :
Chou, Hong-Zu ; Chang, Kai-Hui ; Kuo, Sy-Yen
Author_Institution :
Electr. Eng. Dept., Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
Optimizing blocks in a System-on-Chip (SoC) circuit is becoming more and more important nowadays due to the use of third-party Intellectual Properties (IPs) and reused design blocks. In this paper, we propose techniques and methodologies that utilize abundant external don´t-cares that exist in an SoC environment for block optimization. Our symbolic code-statement reachability analysis can extract don´t-care conditions from constrained-random testbenches or other design blocks to identify unreachable conditional blocks in the design code. Those blocks can then be removed before logic synthesis is performed to produce smaller and more power-efficient final circuits. Our results show that we can optimize designs under different constraints and provide additional flexibility for SoC design flows.
Keywords :
industrial property; logic design; reachability analysis; system-on-chip; SoC design; block optimization; constrained-random testbenches; logic synthesis; power-efficient final circuits; reused design blocks; symbolic code-statement reachability analysis; system-on-chip; system-on-chip circuit; third-party intellectual properties; Analytical models; Circuit optimization; Circuit simulation; Circuit synthesis; Circuit testing; Constraint optimization; Design optimization; Performance evaluation; Reachability analysis; Software performance;
Conference_Titel :
Design Automation Conference (ASP-DAC), 2010 15th Asia and South Pacific
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-5765-6
Electronic_ISBN :
978-1-4244-5767-0
DOI :
10.1109/ASPDAC.2010.5419784