DocumentCode
1568170
Title
Research on electrostatic between metallic particle and semiconductor matrixes
Author
Yu, Gefei
Author_Institution
Res. Sect. of EMC & Electrostatics, Shanghai Maritime Univ., Shanghai, China
fYear
2009
Abstract
By studying the charging between metallic particle and semiconductor matrixes, especially take the Ag-Cs2O as an example, the electrostatic and electrical characters between metallic particle and semiconductor matrixes was proposed. Simulation results show that the electrostatic characters between metallic particle and semiconductor matrixes can achieve better performance than that of equal power allocation based Ag-Cs2O of previous research. Ag-Cs2O was taken as an example to progress a further research on the electrostatic character of metallic particle and semiconductor matrixes in this paper.
Keywords
caesium compounds; semiconductor materials; semiconductor-metal boundaries; silver; Ag-Cs2O; charging; electrical characters; electrostatic characters; metallic particle; semiconductor matrixes; Conductors; Electric variables measurement; Electromagnetic compatibility; Electrons; Electrostatic measurements; Instruments; Neodymium; Particle measurements; Plasma density; Space charge; charging; electrostatics; matrixes;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Measurement & Instruments, 2009. ICEMI '09. 9th International Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4244-3863-1
Electronic_ISBN
978-1-4244-3864-8
Type
conf
DOI
10.1109/ICEMI.2009.5274837
Filename
5274837
Link To Document