• DocumentCode
    1568170
  • Title

    Research on electrostatic between metallic particle and semiconductor matrixes

  • Author

    Yu, Gefei

  • Author_Institution
    Res. Sect. of EMC & Electrostatics, Shanghai Maritime Univ., Shanghai, China
  • fYear
    2009
  • Abstract
    By studying the charging between metallic particle and semiconductor matrixes, especially take the Ag-Cs2O as an example, the electrostatic and electrical characters between metallic particle and semiconductor matrixes was proposed. Simulation results show that the electrostatic characters between metallic particle and semiconductor matrixes can achieve better performance than that of equal power allocation based Ag-Cs2O of previous research. Ag-Cs2O was taken as an example to progress a further research on the electrostatic character of metallic particle and semiconductor matrixes in this paper.
  • Keywords
    caesium compounds; semiconductor materials; semiconductor-metal boundaries; silver; Ag-Cs2O; charging; electrical characters; electrostatic characters; metallic particle; semiconductor matrixes; Conductors; Electric variables measurement; Electromagnetic compatibility; Electrons; Electrostatic measurements; Instruments; Neodymium; Particle measurements; Plasma density; Space charge; charging; electrostatics; matrixes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Measurement & Instruments, 2009. ICEMI '09. 9th International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-3863-1
  • Electronic_ISBN
    978-1-4244-3864-8
  • Type

    conf

  • DOI
    10.1109/ICEMI.2009.5274837
  • Filename
    5274837