• DocumentCode
    1568175
  • Title

    Engineering realization of triple harmonic method on in-situ FH test

  • Author

    Zhi-Min Yuan ; Bo Liu ; Sheng-Bin Hu ; Wei Zhang

  • Author_Institution
    Data Storage Inst., Singapore, Singapore
  • fYear
    2002
  • Abstract
    Summary form only given. As technology moves to sub 10 nm slider disk spacing, it becomes more important to characterize the dynamic slider disk interaction. The optical flying height (FH) tester has its limitations on some certain dynamic processes, such as slider-lube-disk interaction, and track seeking process. The in-situ FH test methods can be the solution to the above processes and are attracting more attention now. The harmonic ratio flyheight (HRF) method uses two harmonics of all ones data pattern to in-situ test FH, which has many advantages among reported in-situ methods. But the intensity of higher order harmonic signal of its all ones pattern is too low when compared with that of its first harmonic, especially, at high user density (PW50/bitlength), and the testing accuracy is affected. In order to improve the signal intensity of higher order harmonic, the authors proposed triple harmonic method, which uses (111100) code to in-situ measure FH. From the point of view of engineering realization, this work pays more attention to the engineering issues of triple harmonic method.
  • Keywords
    disc drives; hard discs; harmonics; mechanical testing; 0 to 10 nm; HDD; dynamic processes; dynamic slider disk interaction; harmonic ratio flyheight; higher order harmonic signal; in-situ FH test; optical flying height tester; signal intensity; slider disk spacing; slider-lube-disk interaction; testing accuracy; track seeking process; triple harmonic method; user density; Etching; Friction; Ion beams; Lubricants; Optical recording; Surface texture; Testing; Tribology; Velocity measurement; Vibrations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
  • Conference_Location
    Amsterdam, The Netherlands
  • Print_ISBN
    0-7803-7365-0
  • Type

    conf

  • DOI
    10.1109/INTMAG.2002.1001038
  • Filename
    1001038