• DocumentCode
    1568193
  • Title

    Results of Recent 14 MeV Neutron Single Event Effects Measurements Conducted by the Jet Propulsion Laboratory

  • Author

    Irom, Farokh ; Miyahira, Tetsuo F. ; Nguyen, Duc N. ; Jun, Insoo ; Normand, Eugene

  • Author_Institution
    California Inst. of Technol., Pasadena
  • Volume
    0
  • fYear
    2007
  • Firstpage
    141
  • Lastpage
    145
  • Abstract
    This paper reports 14 MeV neutron induced single-event effects results for a variety of microelectronic devices that include an ADC, operational amplifiers, optocoupler, flash memory, PowerPC microprocessor, SRAM, and SDRAM. Data were collected to evaluate these devices for possible use in NASA spacecraft.
  • Keywords
    DRAM chips; SRAM chips; aerospace testing; analogue-digital conversion; flash memories; microprocessor chips; neutron effects; operational amplifiers; space vehicles; ADC; NASA spacecraft; SDRAM; SRAM; electron volt energy 14 MeV; flash memory; jet propulsion laboratory; microelectronic devices; neutron induced single event effect measurement; operational amplifiers; optocoupler; powerPC microprocessor; Flash memory; Laboratories; Microelectronics; Microprocessors; Neutrons; Operational amplifiers; Power amplifiers; Propulsion; Random access memory; SDRAM;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2007 IEEE
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    978-1-4244-1464-2
  • Type

    conf

  • DOI
    10.1109/REDW.2007.4342555
  • Filename
    4342555
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1568193