DocumentCode :
1568218
Title :
Efficient power grid integrity analysis using on-the-fly error check and reduction
Author :
Li, Duo ; Tan, Sheldon X D ; Mi, Ning ; Cai, Yici
Author_Institution :
Dept. of Electr. Eng., Univ. of California, Riverside, CA, USA
fYear :
2010
Firstpage :
763
Lastpage :
768
Abstract :
In this paper, we present a new voltage IR drop analysis approach for large on-chip power delivery networks. The new approach is based on recently proposed sampling based reduction technique to reduce the circuit matrices before the simulation. Due to the disruptive nature of tap current waveforms in typical industry power grid networks, input current sources typically has wide frequency power spectrum. To avoid the excessively sampling, the new approach introduces an error check mechanism and on-the-fly error reduction scheme during the simulation of the reduced circuits to improve the accuracy of estimating the the large IR drops. The proposed method presents a new way to combine model order reduction and simulation to achieve the overall efficiency of simulation. The new method can also easily trade errors for speed for different applications. Experimental results show the proposed IR drop analysis method can significantly reduce the errors of the existing ETBR method at the similar computing cost, while it can have 10X and more speedup over the the commercial power grid simulator in UltraSim with about 1-2% errors on a number of real industry benchmark circuits.
Keywords :
distribution networks; electric potential; power grids; power system simulation; transmission networks; benchmark circuits; commercial power grid simulator; error check mechanism; frequency power spectrum; large on-chip power delivery networks; on-the-fly error check and reduction; power grid integrity analysis; tap current waveforms; voltage IR drop analysis; Circuit analysis computing; Circuit simulation; Computational modeling; Error analysis; Frequency; Grid computing; Network-on-a-chip; Power grids; Sampling methods; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (ASP-DAC), 2010 15th Asia and South Pacific
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-5765-6
Electronic_ISBN :
978-1-4244-5767-0
Type :
conf
DOI :
10.1109/ASPDAC.2010.5419788
Filename :
5419788
Link To Document :
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