• DocumentCode
    1568241
  • Title

    Single event effects hardening and characterization of honeywell´s pass 3 RHPPC processor integrated circuit

  • Author

    Lintz, John P. ; Hoffmann, Lee F. ; Smith, Matthew J. ; Van Cleave, Russell T. ; Cizmarik, Ryan R.

  • Author_Institution
    Honeywell Aerosp., Clearwater
  • Volume
    0
  • fYear
    2007
  • Firstpage
    162
  • Lastpage
    166
  • Abstract
    We describe a single event effects evaluation of Honeywell´s radiation-hardened Pass 3 RHPPC processor, which is functionally and pin-compatible with the commercial PowerPC 603eTM. Results support an upset rate of 1x10-5 upsets/chip-day in geosynchronous orbit.
  • Keywords
    aerospace components; cosmic ray interactions; integrated circuit design; microprocessor chips; radiation hardening (electronics); space vehicles; Honeywell´s radiation-hardened Pass 3 RHPPC processor integrated circuit; PowerPC 603e; galactic cosmic ray environment; geosynchronous earth orbit; single event effects evaluation; Built-in self-test; Clocks; Cyclotrons; Electronics packaging; Microprocessors; Protons; Registers; Silicon on insulator technology; Single event upset; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2007 IEEE
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    978-1-4244-1464-2
  • Type

    conf

  • DOI
    10.1109/REDW.2007.4342558
  • Filename
    4342558
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1568241