• DocumentCode
    1568273
  • Title

    Static Proton and Heavy Ion Testing of the Xilinx Virtex-5 Device

  • Author

    Quinn, Heather ; Morgan, Keith ; Graham, Paul ; Krone, Jim ; Caffrey, Michael

  • Author_Institution
    Los Alamos Nat. Lab., Los Alamos
  • Volume
    0
  • fYear
    2007
  • Firstpage
    177
  • Lastpage
    184
  • Abstract
    This paper presents proton and heavy ion static results for the latest Xilinx field-programmable gate arrays (FPGAs). The paper analyzes static bit cross-sections, resources, multiple-bit upsets (MBUs) and angular effects.
  • Keywords
    field programmable gate arrays; proton effects; semiconductor device testing; FPGA; Xilinx Virtex-5 device; Xilinx field-programmable gate arrays; angular effects; heavy ion testing; multiple-bit upsets; proton testing; static bit cross-sections; Aerospace testing; Circuits; Cyclotrons; Digital signal processing; Field programmable gate arrays; Laboratories; Protons; Random access memory; Routing; Table lookup;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2007 IEEE
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    978-1-4244-1464-2
  • Type

    conf

  • DOI
    10.1109/REDW.2007.4342561
  • Filename
    4342561
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1568273