DocumentCode :
1568419
Title :
High rate deposition of Mn-Zn spinel ferrite thin films using reactive facing targets sputtering
Author :
Saito, S. ; Kong, S.H. ; Nakagawa, S.
Author_Institution :
Dept. of Phys. Electron., Tokyo Inst. of Technol., Japan
fYear :
2002
Abstract :
Summary form only given. Spinel ferrite thin film can be regarded as one of the hopeful candidates for a backlayer of perpendicular magnetic recording media because of its high resistivity and high permeability. Facing Targets Sputtering (FTS) system is suitable for the deposition of ferrite thin films because of the suppression of radiation damage to the growing films by the high energy negative oxygen ions. Ferrite thin films have been deposited usually by sputtering oxide target material, however, the deposition rate of it was quite low because of low sputtering power density to avoid large power loss in the bulk target and thermal effect. In order to apply spinel ferrite films to the backlayer, deposition rate should be increased to satisfy the productivity. In this study, Mn-Zn ferrite thin films were successfully deposited on Pt[111] underlayer by reactive FTS method in as-deposited state. The deposition rate was one order of magnitude higher than that of conventional method.
Keywords :
ferrites; magnetic permeability; magnetic thin films; manganese compounds; perpendicular magnetic recording; sputtered coatings; zinc compounds; (MnZn)Fe/sub 2/O/sub 4/; Mn-Zn spinel ferrite thin films; Pt[111] underlayer; backlayer; high energy negative oxygen ions; high permeability; high rate deposition; high resistivity; perpendicular magnetic recording media; radiation damage suppression; reactive facing targets sputtering; sputtering oxide target material; Amorphous magnetic materials; Ferrite films; Frequency; Magnetic films; Magnetic levitation; Magnetostriction; Saturation magnetization; Sputtering; Voltage; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
Conference_Location :
Amsterdam, The Netherlands
Print_ISBN :
0-7803-7365-0
Type :
conf
DOI :
10.1109/INTMAG.2002.1001056
Filename :
1001056
Link To Document :
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