Title :
Statistical time borrowing for pulsed-latch circuit designs
Author :
Paik, Seungwhun ; Yu, Lee-eun ; Shin, Youngsoo
Author_Institution :
Dept. of Electr. Eng., KAIST, Daejeon, South Korea
Abstract :
Pulsed-latch inherits the advantage of latch in less sequencing overhead while taking the advantage of flip-flop in its convenience during timing analysis. Even though this advantage comes from the fact that pulsed-latch uses a short pulse, it is still capable of a small amount of time borrowing. A problem of allocating pulse width (out of a few predefined widths), where each width is modeled by a random variable, is formulated for minimizing the clock period of pulsed-latch circuits; this is equivalent to assigning a random variable that represents the amount of time borrowed by the combinational block between each latch pair. A statistical approach is important in this problem because assuming +3¿ of all pulse widths does not represent the worst case. An allocation algorithm called SPWA as well as an algorithm to compute timing yield is proposed. In experiments with 45-nm technology, compared to the case of no time borrowing, the clock period was reduced by 12.2% and 11.7% on average when the yield constraint Yc is 0.85 and 0.95, respectively; this is compared to the deterministic counterpart called DPWA, which reduced the clock period by 7.6% and 7.3%. More importantly, DPWA failed to satisfy the yield constraints in four (out of eleven) circuits while the yield constraints were always satisfied in SPWA.
Keywords :
combinational circuits; flip-flops; logic design; timing; combinational block; deterministic pulse width allocation; pulsed-latch circuit designs; sequencing overhead; size 45 nm; statistical pulse width allocation; statistical time borrowing; timing analysis; timing yield; Circuit synthesis; Clocks; Costs; Flip-flops; Latches; Pulse circuits; Pulse generation; Random variables; Space vector pulse width modulation; Timing;
Conference_Titel :
Design Automation Conference (ASP-DAC), 2010 15th Asia and South Pacific
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-5765-6
Electronic_ISBN :
978-1-4244-5767-0
DOI :
10.1109/ASPDAC.2010.5419801