• DocumentCode
    1568562
  • Title

    Force acquisition system for digital impact tester

  • Author

    Fu, Yongling ; Han, Guohui ; Li, Gangjun

  • Author_Institution
    Sch. of Autom. Sci. & Electr. Eng., Beihang Univ., Beijing, China
  • fYear
    2009
  • Abstract
    A force acquisition system for digital impact tester was investigated, in which structural design of bar-shaped elastic element, circuit design as well as static analysis were involved. Based on analysis of international requirements on the detection precision of digital impact tester, information concerning the precision of sensor parameters, sensors and adhesive was collected, and adhesion sites were settled through finite element analysis and optimization. Circuit design involved zero setting, temperature compensation, amplifying circuit, filter circuit and circuits to connect host computer. Loading calibration test was performed on sensors under static working condition. According to partial authoritative examination, the linearity was 0.06%, the repetitiveness was 0.01%, the retardation was 0.08%, and the sensitivity was 1.112 mV/V. According to the examination conducted in some metrology institute, the total work error of impact in a digital impact tester adopting the above force acquisition system was 2% of the impact value of a standard specimen, which has already reached the precision level and met the design requirement.
  • Keywords
    finite element analysis; force sensors; impact (mechanical); impact testing; amplifying circuit; bar-shaped elastic element; circuit design; digital impact tester; filter circuit; finite element analysis; force acquisition system; temperature compensation; zero setting; Adhesives; Calibration; Circuit synthesis; Circuit testing; Filters; Finite element methods; Force sensors; Information analysis; System testing; Temperature sensors; amplifying circuit; digital impact tester; force acquisition system; force sensor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Measurement & Instruments, 2009. ICEMI '09. 9th International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-3863-1
  • Electronic_ISBN
    978-1-4244-3864-8
  • Type

    conf

  • DOI
    10.1109/ICEMI.2009.5274865
  • Filename
    5274865