DocumentCode
1568562
Title
Force acquisition system for digital impact tester
Author
Fu, Yongling ; Han, Guohui ; Li, Gangjun
Author_Institution
Sch. of Autom. Sci. & Electr. Eng., Beihang Univ., Beijing, China
fYear
2009
Abstract
A force acquisition system for digital impact tester was investigated, in which structural design of bar-shaped elastic element, circuit design as well as static analysis were involved. Based on analysis of international requirements on the detection precision of digital impact tester, information concerning the precision of sensor parameters, sensors and adhesive was collected, and adhesion sites were settled through finite element analysis and optimization. Circuit design involved zero setting, temperature compensation, amplifying circuit, filter circuit and circuits to connect host computer. Loading calibration test was performed on sensors under static working condition. According to partial authoritative examination, the linearity was 0.06%, the repetitiveness was 0.01%, the retardation was 0.08%, and the sensitivity was 1.112 mV/V. According to the examination conducted in some metrology institute, the total work error of impact in a digital impact tester adopting the above force acquisition system was 2% of the impact value of a standard specimen, which has already reached the precision level and met the design requirement.
Keywords
finite element analysis; force sensors; impact (mechanical); impact testing; amplifying circuit; bar-shaped elastic element; circuit design; digital impact tester; filter circuit; finite element analysis; force acquisition system; temperature compensation; zero setting; Adhesives; Calibration; Circuit synthesis; Circuit testing; Filters; Finite element methods; Force sensors; Information analysis; System testing; Temperature sensors; amplifying circuit; digital impact tester; force acquisition system; force sensor;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Measurement & Instruments, 2009. ICEMI '09. 9th International Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4244-3863-1
Electronic_ISBN
978-1-4244-3864-8
Type
conf
DOI
10.1109/ICEMI.2009.5274865
Filename
5274865
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